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atpg slot automatic test pattern generation of digital circuits Test response slot of a PC The instrument results in a low-cost and high-performance

ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (full scan,

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ATPG refers to a structured DFT technique utilized in the testing and design of VLSI circuits It's a process that generates test patterns applicable to a VLSI

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